Anisotropic etching of organic-containing insulating layers

The present invention is related to a method for forming at least one opening in an organic-containing insulating layer comprising the step of: covering said organic-containing insulating layer with a bilayer, said bilayer comprising a resist hard mask layer, being formed on said organic-containing...

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Bibliographic Details
Main Authors VANHAELEMEERSCH, SERGE, RODIONOVICH BAKLANOV, MIKHAIL
Format Patent
LanguageEnglish
French
German
Published 25.02.2009
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Summary:The present invention is related to a method for forming at least one opening in an organic-containing insulating layer comprising the step of: covering said organic-containing insulating layer with a bilayer, said bilayer comprising a resist hard mask layer, being formed on said organic-containing insulating layer, and a resist layer being formed on said resist hard mask layer, patterning said bilayer, creating said opening by plasma etching said organic-containing insulating layer in a reaction chamber containing a gaseous mixture, said gaseous mixture comprising an oxygen-containing gas and an inert gas, said inert gas and said oxygen-containing gas being present in said gaseous mixture at a predetermined ratio, said ratio being chosen such that spontaneous etching is substantially avoided.
Bibliography:Application Number: EP20030076935