SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

There is provided a semiconductor device, comprising a substrate (101) that includes an integrated circuit region (1), first and second interlayer insulation films (108, 111, 112) formed above the substrate, and a reinforcing structure comprising a main-wall part (2) and a sub-wall part (3) which ar...

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Bibliographic Details
Main Authors Watanabe, Kenichi, Kawano, Michiari, Sukegawa, Kazuo, Mitani, Junichi, Sawada, Toyoji, Hasegawa, Takumi, Namba, Hiroshi
Format Patent
LanguageEnglish
French
German
Published 15.05.2019
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Summary:There is provided a semiconductor device, comprising a substrate (101) that includes an integrated circuit region (1), first and second interlayer insulation films (108, 111, 112) formed above the substrate, and a reinforcing structure comprising a main-wall part (2) and a sub-wall part (3) which are formed in the first and second interlayer insulation films, wherein the main-wall part surrounds the integrated circuit region in a periphery thereof and the sub-wall part is provided apart from the main-wall part in a corner region of the semiconductor device and is located between the integrated circuit region and the first bend section of the main-wall part. Both the main-wall part and the sub-wall part are formed by metal-filled trenches (131, 132) in the first and second interlayer insulation films.
Bibliography:Application Number: EP20030003482