X-Ray apparatus

X-ray analysis device for examination of material samples comprises a sample table (2) that allows griping of samples (1) from different rows independent of a gripper device (4), parallel to a y direction with the table arranged in the X-Y plane.

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Bibliographic Details
Main Authors WATTS, A.M, HARDMAN, P.J, MAUSER, KARL-EUGEN, GREENBANK, M.G.M
Format Patent
LanguageEnglish
French
German
Published 12.11.2003
Edition7
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:X-ray analysis device for examination of material samples comprises a sample table (2) that allows griping of samples (1) from different rows independent of a gripper device (4), parallel to a y direction with the table arranged in the X-Y plane.
Bibliography:Application Number: EP20020018405