Process and device for determining of physical collective parameters of particles in gas

The method involves subjecting the particles to electromagnetic radiation that is scattered on the particles, determining the intensity of the scattered radiation in at least two different scattering regions and setting them in relation to each other. One scattering region contains the forward scatt...

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Bibliographic Details
Main Authors EISEN, HANS JUERGEN, SACHWEH, BERND, RAEDLE, MATTHIAS, BIERMANN, HELMUT, REUVERS, JOHANNES G.,DR, ETTMUELLER, JUERGEN, HEFFELS, CAMIEL
Format Patent
LanguageEnglish
French
German
Published 29.10.2003
Edition7
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:The method involves subjecting the particles to electromagnetic radiation that is scattered on the particles, determining the intensity of the scattered radiation in at least two different scattering regions and setting them in relation to each other. One scattering region contains the forward scattering region and another the rearward scattering region. Independent claims are also included for the following: (1) an arrangement for determining collective physical parameters of particles in gases; (2) a use of the method for aerosols in gases; (3) a computer program for implementing the method; (4) a data medium with a computer program.
Bibliography:Application Number: EP20010117674