METHOD AND DEVICE FOR TESTING CAPACITORS INTEGRATED ON A SEMICONDUCTOR CHIP
The invention relates to a method and device for the improved application of the principle of charge transfer over so-called bucket brigades for testing integrated capacitors (C1,...CN; N>=2). This bucket brigade principle is combined in an advantageous manner with a network of switches (S11...S1...
Saved in:
| Main Authors | , , |
|---|---|
| Format | Patent |
| Language | English French German |
| Published |
23.11.2005
|
| Edition | 7 |
| Subjects | |
| Online Access | Get full text |
Cover
Loading…
| Abstract | The invention relates to a method and device for the improved application of the principle of charge transfer over so-called bucket brigades for testing integrated capacitors (C1,...CN; N>=2). This bucket brigade principle is combined in an advantageous manner with a network of switches (S11...S14; S21, S22...; S31, S32...; SU) and with a comparator (V). |
|---|---|
| AbstractList | The invention relates to a method and device for the improved application of the principle of charge transfer over so-called bucket brigades for testing integrated capacitors (C1,...CN; N>=2). This bucket brigade principle is combined in an advantageous manner with a network of switches (S11...S14; S21, S22...; S31, S32...; SU) and with a comparator (V). |
| Author | SMOLA, MICHAEL OTTERSTEDT, JAN LEINEWEBER, HUBERT |
| Author_xml | – fullname: OTTERSTEDT, JAN – fullname: LEINEWEBER, HUBERT – fullname: SMOLA, MICHAEL |
| BookMark | eNqNyk0KwjAQQOEsdOHfHeYCQoMgbuNk2gzSJKRTt6VIXElaqPdHFx7A1Vt8b6tWZSp5o24tiQsWjLdg6c5IUIcEQp2wbwBNNMgSUgfshZpkhCwEDwY6ahmDtz1-GdBx3Kv1c3wt-fDrTkFNgu6Y52nIyzw-csnvgaLW-lJV56s-_bF8ADMNLrY |
| ContentType | Patent |
| DBID | EVB |
| DatabaseName | esp@cenet |
| DatabaseTitleList | |
| Database_xml | – sequence: 1 dbid: EVB name: esp@cenet url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP sourceTypes: Open Access Repository |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Medicine Chemistry Sciences Physics |
| DocumentTitleAlternate | VERFAHREN UND VORRICHTUNG ZUM TESTEN VON AUF EINEM HALBLEITERCHIP INTEGRIERTEN KONDENSATOREN PROCEDE ET DISPOSITIF PERMETTANT DE TESTER DES CONDENSATEURS INTEGRES A UNE PUCE SEMI-CONDUCTRICE |
| Edition | 7 |
| ExternalDocumentID | EP1118006B1 |
| GroupedDBID | EVB |
| ID | FETCH-epo_espacenet_EP1118006B13 |
| IEDL.DBID | EVB |
| IngestDate | Fri Jul 19 14:19:44 EDT 2024 |
| IsOpenAccess | true |
| IsPeerReviewed | false |
| IsScholarly | false |
| Language | English French German |
| LinkModel | DirectLink |
| MergedId | FETCHMERGED-epo_espacenet_EP1118006B13 |
| Notes | Application Number: EP19990969498 |
| OpenAccessLink | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20051123&DB=EPODOC&CC=EP&NR=1118006B1 |
| ParticipantIDs | epo_espacenet_EP1118006B1 |
| PublicationCentury | 2000 |
| PublicationDate | 20051123 |
| PublicationDateYYYYMMDD | 2005-11-23 |
| PublicationDate_xml | – month: 11 year: 2005 text: 20051123 day: 23 |
| PublicationDecade | 2000 |
| PublicationYear | 2005 |
| RelatedCompanies | INFINEON TECHNOLOGIES AG |
| RelatedCompanies_xml | – name: INFINEON TECHNOLOGIES AG |
| Score | 2.6321952 |
| Snippet | The invention relates to a method and device for the improved application of the principle of charge transfer over so-called bucket brigades for testing... |
| SourceID | epo |
| SourceType | Open Access Repository |
| SubjectTerms | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| Title | METHOD AND DEVICE FOR TESTING CAPACITORS INTEGRATED ON A SEMICONDUCTOR CHIP |
| URI | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20051123&DB=EPODOC&locale=&CC=EP&NR=1118006B1 |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1La8JAEB7EPm-tbdG-2EPJLVRNTPQgJe6uJi15oFG8ybpJwItKTenf72xqbC_tbZmFYXdgnjvzLcBTq2vLbmqkeruT2bqZWabek0miJ6nCdmkKtIeqNOAHljs1X-edeQVW5SxMgRP6WYAjokZJ1Pe8sNfbnyIWK3ord8_LFZI2L8O4z7QyO1bhg6GxQZ9HIQupRimutGDcbymos6Y1wETpCKNoWykDnw3UUMr2t0cZXsBxhMzW-SVUkrQGZ7T8eK0Gp_7-vbsGJ0WDptwhca-Euyt483nshow4ASOMzzzKCaZyJOaT2AtGhDqRQ704HE-IwrsdjR00TiQMiEMmSuhhwKYUtwl1vegayJDH1NXxfIuDLBY8OtzEuIHqerNO60AEhnWZyMxeWxpmV8ilQiWThpCWKYVo2g1o_Mnm9p-9Ozj_hipt6W3jHqr5-0f6gE44Xz4W4vsCJsGEQw |
| link.rule.ids | 230,309,783,888,25576,76876 |
| linkProvider | European Patent Office |
| linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LT8JAEJ4QfOBNUSM-92B6awRaWjgQU3YXWqGPQCHcSLttEy5ApMa_72wF9KK3zWwy2Z1knjvzLcBzo22KdqqlarOVmaqeGbraEUmiJqnEdqlHaA9lacD1DHuqv81b8xIs97MwBU7oZwGOiBolUN_zwl5vfopYrOit3L7ESyStX_thlyn77FiGD5rCel0e-MynCqW4UrxxtyGhzupGDxOlI4ywTakMfNaTQymb3x6lfw7HATJb5RdQStIqVOj-47UqnLq79-4qnBQNmmKLxJ0Sbi9h6PLQ9hmxPEYYnzmUE0zlSMgnoeMNCLUCizqhP54QiXc7GFtonIjvEYtMpNB9j00pbhNqO8EVkD4Pqa3i-RYHWSx4cLiJdg3l1XqV3gCJMKzLokzvNIWmtyMRS1QyoUXC0EUU1c0a1P5kc_vP3hNU7NAdLUaON7yDs2_Y0oba1O6hnL9_pA_okPP4sRDlF4cchzY |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=METHOD+AND+DEVICE+FOR+TESTING+CAPACITORS+INTEGRATED+ON+A+SEMICONDUCTOR+CHIP&rft.inventor=OTTERSTEDT%2C+JAN&rft.inventor=LEINEWEBER%2C+HUBERT&rft.inventor=SMOLA%2C+MICHAEL&rft.date=2005-11-23&rft.externalDBID=B1&rft.externalDocID=EP1118006B1 |