METHOD AND DEVICE FOR TESTING CAPACITORS INTEGRATED ON A SEMICONDUCTOR CHIP

The invention relates to a method and device for the improved application of the principle of charge transfer over so-called bucket brigades for testing integrated capacitors (C1,...CN; N>=2). This bucket brigade principle is combined in an advantageous manner with a network of switches (S11...S1...

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Bibliographic Details
Main Authors OTTERSTEDT, JAN, LEINEWEBER, HUBERT, SMOLA, MICHAEL
Format Patent
LanguageEnglish
French
German
Published 23.11.2005
Edition7
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:The invention relates to a method and device for the improved application of the principle of charge transfer over so-called bucket brigades for testing integrated capacitors (C1,...CN; N>=2). This bucket brigade principle is combined in an advantageous manner with a network of switches (S11...S14; S21, S22...; S31, S32...; SU) and with a comparator (V).
Bibliography:Application Number: EP19990969498