METHOD FOR QUANTITATIVE ANALYSIS OF ATOMIC COMPONENTS OF MATERIALS BY LIBS SPECTROSCOPY MEASUREMENTS

A method based on the LIBS technique is described, which allows to determine, without calibration of the measurement system, the concentration of atomic components in solid, liquid and aerial samples. The method comprises: (a) obtaining the plasma temperature (T) of at least one species of the emitt...

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Bibliographic Details
Main Authors PALLESCHI, VINCENZO, CIUCCI, ALESSANDRO, RASTELLI, SIMONE, TOGNONI, ELISABETTA
Format Patent
LanguageEnglish
French
German
Published 07.01.2004
Edition7
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:A method based on the LIBS technique is described, which allows to determine, without calibration of the measurement system, the concentration of atomic components in solid, liquid and aerial samples. The method comprises: (a) obtaining the plasma temperature (T) of at least one species of the emitted radiation; (b) determining the partition function U (T) of each species of the emitted radiation at the plasma temperature; (c) calculating the concentration value of each species once deducted an experimental factor (F); (d) calculating the concentration value of each non-individuated species by Saha equation; (e) calculating the concentration of atomic components as sum of the corresponding species concentrations; (f) measurement of the concentration of components by eliminating the experimental factor through normalization.
Bibliography:Application Number: EP19990915670