METHOD TO MONITOR AND CONTROL PROCESSES WITH ON-LINE QUARTZ CRYSTAL MICROBALANCE SENSORS

Thickness-shear mode resonators which simultaneously measure mass deposition and fluid properties can be utilized to monitor petroleum processing, petrochemical and water treatment systems. Specialty chemical additive materials can be accurately and instantaneously added to control conditions detect...

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Bibliographic Details
Main Authors POINDEXTER, MICHAEL, K, MCCLAIN, ROBERT, D, KRAUS, PAUL, R
Format Patent
LanguageEnglish
French
German
Published 05.06.2002
Edition7
Subjects
ACYCLIC OR CARBOCYCLIC COMPOUNDS
APPARATUS THEREFOR
CHEMISTRY
CONTROLLING
CRACKING HYDROCARBON OILS
FUELS
GENERAL METHODS OF ORGANIC CHEMISTRY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
LUBRICANTS
MEASURING
METALLURGY
MINERAL WAXES
ORGANIC CHEMISTRY
PEAT
PETROLEUM, GAS OR COKE INDUSTRIES
PHYSICS
PRODUCTION OF LIQUID HYDROCARBON MIXTURES, e.g. BY DESTRUCTIVEHYDROGENATION, OLIGOMERISATION, POLYMERISATION
RECOVERY OF HYDROCARBON OILS FROM OIL-SHALE, OIL-SAND, ORGASES
REFINING MIXTURES MAINLY CONSISTING OF HYDROCARBONS
REFORMING OF NAPHTHA
REGULATING
SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
TECHNICAL GASES CONTAINING CARBON MONOXIDE
TESTING
TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
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Summary:Thickness-shear mode resonators which simultaneously measure mass deposition and fluid properties can be utilized to monitor petroleum processing, petrochemical and water treatment systems. Specialty chemical additive materials can be accurately and instantaneously added to control conditions detected by the thickness-shear mode resonators. The thickness-shear mode resonators are piezoelectric crystals used in conjunction with oscillator circuitry that can determine mass as well as viscosity and/or density of a fluid in contact with the piezoelectric surface.
Bibliography:Application Number: EP19970917601