Polishstop planarization method and structure

The invention provides a method for producing a substantially planar surface overlying features (40) of a semiconductor structure (38). The method comprises forming alternating layers of a hard polishing material (40,48) and a soft polishing material (46,50) the features (40) of the semiconductor st...

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Bibliographic Details
Main Authors LEACH, MICHAEL ALBERT, BURKE, PETER AUSTIN
Format Patent
LanguageEnglish
French
German
Published 26.10.1994
Edition5
Subjects
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Summary:The invention provides a method for producing a substantially planar surface overlying features (40) of a semiconductor structure (38). The method comprises forming alternating layers of a hard polishing material (40,48) and a soft polishing material (46,50) the features (40) of the semiconductor structure (38), and then polishing the alternating layers to form a substantially planar surface over the features (40).
Bibliography:Application Number: EP19940104346