METHOD FOR CORRECTING SPECTRAL AND IMAGING DATA AND FOR USING SUCH CORRECTED DATA IN MAGNET SHIMMING

• Main Author: DUNKEL, REINHARD
• Format: Patent
• Language: English; French; German
• Published: 14.02.2001
• Edition: 7
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

Spectral and imaging data can be corrected for various types of distortion, such as phase and baseline distortion, by fitting a mathematical model of the expected data to the experimental data. The model includes parameters relating to the distortions to be corrected. The model is fitted to the data by adjusting the parameters of the model, generally through a regression analysis, and when a best fit is obtained, the parameters resulting in the best fit provide the information necessary to correct the data. For example, phase parameters determined in fitting the model to the data can be used to determine a phase function to be applied to the data to phase correct the data, or the various other parameters determined may be used in the model with the phase parameters set to zero to calculate the simulated phase corrected data. Parameter for baseline or other distortions may be similarly obtained and used. The method of the invention may be used to produce phase and baseline corrected spectra, or the corrected data may be used in further aspects of the invention such as in magnet shimming wherein phased spectral data is used in connection with a magnet shim coil distortion model or in connection with movement minimization of the resonance frequency distribution to direct the shimming of magnets.