Laser apparatus with means for detecting the laser power level
Apparatus for detection of laser output on a semiconductor wafer, wherein the laser and detector can be formed by similar or simultaneous processes on the same semiconductor substrate. More particularly, a laser cavity and a detection cavity (13, 19) are formed on a semiconductor wafer (11) in paral...
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Main Authors | , , , |
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Format | Patent |
Language | English French German |
Published |
17.01.1996
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Edition | 5 |
Subjects | |
Online Access | Get full text |
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Summary: | Apparatus for detection of laser output on a semiconductor wafer, wherein the laser and detector can be formed by similar or simultaneous processes on the same semiconductor substrate. More particularly, a laser cavity and a detection cavity (13, 19) are formed on a semiconductor wafer (11) in parallel, such that light emitted laterally from the laser cavity is detected by the detection cavity. The amount of light detected can then be transformed into data, which in turn can be used to control the output of the laser. Advantages of the present invention include the ability to simultaneously form the laser and detector portions. The detector portion does not interfere with the beam being provided by the laser, and multiple laser-sensor pairs can be integrated on a single semiconductor substrate. |
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Bibliography: | Application Number: EP19910302758 |