Thin film semiconductor device

A thin film semiconductor device includes a gate electrode (401), a gate insulating layer (402), a thin film semiconductor layer (403), an ohmic layer (406) source and drain electrodes (404,405) and a protective layer (409). The protective layer contains an impurity for controlling conductivity.

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Bibliographic Details
Main Authors ISHII, TAKAYUKI, YAMANOBE, MASATO
Format Patent
LanguageEnglish
French
German
Published 13.03.1996
Edition6
Subjects
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Summary:A thin film semiconductor device includes a gate electrode (401), a gate insulating layer (402), a thin film semiconductor layer (403), an ohmic layer (406) source and drain electrodes (404,405) and a protective layer (409). The protective layer contains an impurity for controlling conductivity.
Bibliography:Application Number: EP19910302658