Thin film semiconductor device
A thin film semiconductor device includes a gate electrode (401), a gate insulating layer (402), a thin film semiconductor layer (403), an ohmic layer (406) source and drain electrodes (404,405) and a protective layer (409). The protective layer contains an impurity for controlling conductivity.
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Main Authors | , |
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Format | Patent |
Language | English French German |
Published |
13.03.1996
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Edition | 6 |
Subjects | |
Online Access | Get full text |
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Summary: | A thin film semiconductor device includes a gate electrode (401), a gate insulating layer (402), a thin film semiconductor layer (403), an ohmic layer (406) source and drain electrodes (404,405) and a protective layer (409). The protective layer contains an impurity for controlling conductivity. |
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Bibliography: | Application Number: EP19910302658 |