Inspection probe

An inspection probe which allows a plurality of such inspection probes to be arranged at a remarkably reduced pitch. The inspection probe comprises a very thin metal wire having a diameter of 120 mu m or less and so shaped as to have self resiliency, and a plated noble metal layer formed on a surfac...

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Bibliographic Details
Main Authors KANETSUKI, YUTAKA, YUTORI, TOSHIAKI
Format Patent
LanguageEnglish
French
German
Published 11.09.1991
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:An inspection probe which allows a plurality of such inspection probes to be arranged at a remarkably reduced pitch. The inspection probe comprises a very thin metal wire having a diameter of 120 mu m or less and so shaped as to have self resiliency, and a plated noble metal layer formed on a surface of the very thin wire. A probe pin head for the inspection of an electronic circuit board is constructed employing a plurality of such inspection probes. The inspection probes are secured to or embedded in a base made of a resin material. A process of producing the probe pin head is also disclosed.
Bibliography:Application Number: EP19910301952