DISCRIMINATIVE FLAW DETECTOR FOR LIGHT-TRANSMISSIVE SHEET MATERIAL

• Main Authors: TANAKA, K. K.K. YASK. DENKI SEISAKUSHO TOKYO KOH, OKAFUJI, MASAHARU NIPPON SHEET GLASS CO., LTD, MIYANO, M. K.K. YASKAWA DENKI SEISAKUSHO TOKYO KOH, TAKEOKA, TATSUO NIPPON SHEET GLASS CO., LTD, ABE, J. K.K. YASKAWA DENKI SEISAKUSHO TOKYO KOH, ICHINOSE, NAGAYOSHI NIPPON SHEET GLASS CO., LTD
• Format: Patent
• Language: English
• Published: 04.08.1993
• Subjects: CHEMISTRY; GLASS; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES; MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; METALLURGY; MINERAL OR SLAG WOOL; PHYSICS; TESTING

Discriminative flaw detector for highly accurate and high speed detection for size and positions of flaws that exist on a travelling light-transmissive sheet material is novel. An optical scanner repeatedly scans the light-transmissive sheet material perpendicularly to the travelling direction of the material. When the optical spot is projected toward the flaws existing on the light-transmissive sheet material, the state of transmitted light, scattered transmitted light, reflected light and scattered reflected light changes depending on the kind of flaws. The changes of these rays of light are deteted by an analyser, converted to electrical signals by a photoelectric device and further processed into flaw data by a flaw data generation circuit. A flaw data input circuit receives the flaw data, classifies these flaw data into flaw data blocks in accordance with the kinds of flaws, thus preparing flaw patterns and reading the address of the flaw data block as position data. The flaw pattern is compared with a flaw discrimination pattern table by an information processing unit to discriminate the kind and size of flaws and the position of the flaw is detected by the position data.