HIGH VOLTAGE SEMICONDUCTOR INTEGRATED CIRCUIT
This semiconductor integrated circuit has high thickness oxide layers such as to ensure the provision of efficient and reliable high-voltage devices, simultaneously eliminating sharp differences of level on the surface of the circuit in the high density signal processing part. The circuit comprises...
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Main Authors | , , |
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Format | Patent |
Language | English |
Published |
27.01.1988
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Edition | 4 |
Subjects | |
Online Access | Get full text |
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Summary: | This semiconductor integrated circuit has high thickness oxide layers such as to ensure the provision of efficient and reliable high-voltage devices, simultaneously eliminating sharp differences of level on the surface of the circuit in the high density signal processing part. The circuit comprises a semiconductor body defined by a plurality of superimposed layers (40-49) having conductivity of opposite types and at least one oxide insulating layer (50-53) extending over a major surface of the semiconductor body at preset portions thereof, the insulating oxide layer, close to the outer delimiting edges of the preset portions, having a decreasing thickness so as to form peripheral regions (55) sloping towards the semiconductor body major surfaces. |
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Bibliography: | Application Number: EP19870100766 |