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A wavelength correction function provides corrected reflectance values from actual reflectance values taken in a reflectance-base instrument. The correction is provided as a function of measured reflectance values and a predefined set of high resolution reflectance values established for the reflect...

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Bibliographic Details
Main Authors BROCK, David, A, HESSER, Donald, R, SHELDRAKE, Kevin, J, KRAUTH, Gary, H, BOGER, David, L, ZUIDEMA, Jack, L
Format Patent
LanguageDanish
Published 07.05.2018
Subjects
CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
COLORIMETRY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PERFORMING OPERATIONS
PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
PHYSICS
RADIATION PYROMETRY
TESTING
TRANSPORTING
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Summary:A wavelength correction function provides corrected reflectance values from actual reflectance values taken in a reflectance-base instrument. The correction is provided as a function of measured reflectance values and a predefined set of high resolution reflectance values established for the reflectance-based instrument implementing the wavelength correction function.
Bibliography:Application Number: DK20040785691T