Optisches Teilchenanalysegerät mit zwei Arten von Lichtquellen

Saved in:
Bibliographic Details
Main Authors SESHIMO, HIROYUKI, SUMA-KU, KOBE-SHI, HYOGO-KEN, JP, TOHORI, HIDEMICHI, TAKASAGO-SHI, HYOGO-KEN, JP, FUKUDA, MASAKAZU, KOBE-SHI, HYOGO-KEN, JP, NAKAMOTO, HIROYUKI, KOBE-SHI, HYOGO-KEN, JP
Format Patent
LanguageGerman
Published 17.08.1995
Edition6
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
Online AccessGet full text

Cover

More Information
Bibliography:Application Number: DE1990617420T