Method and arrangement for the analysis of light spectra and for determining colour

• Main Authors: POPOV, JURI MICHAILOVIC.SC.NAT., MOSKAU/MOSKVA, SU, LOESCHKE, KLAUS.NAT., DDR 1180 BERLIN, DD, SELESNJEV, VLADIMIR NIKOLAEVIC.NAT, MORAWSKI, DIETRICH,., DDR 1113 BERLIN, DD, SCHMIDT, ARMIN, DDR 9363 GORNAU, DD, SCHARFF, WOLFRAM, DR.SC.NAT., DDR 9051 KARL-MARX-STADT, DD, SAGITOV, RINAT GARIFOVIC.NAT., UFA, SU
• Format: Patent
• Language: English; German
• Published: 23.11.1989
• Subjects: BASIC ELECTRIC ELEMENTS; COLORIMETRY; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR; ELECTRICITY; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT; MEASURING; PHYSICS; RADIATION PYROMETRY; SEMICONDUCTOR DEVICES; TESTING

The method and the arrangement for the analysis of light spectra and for the determination of colour has applications in microelectronics, optoelectronics and sensor technology. The solution according to the invention consists in connecting photosensitive semiconductor layers provided with contacts as photoresistors in series, applying a total voltage of 1 mV to 300 V to the photoresistors connected in series, passing the light spectrum to be examined through the photosensitive semiconductor layers, measuring the falling voltage over at least one of the photoresistors and the current in the total circuit, and using the signals for determining the spectral composition and the intensity of the light spectrum. The arrangement according to the invention comprises photosensitive semiconductor layers lying one above the other, between which contacts in the form of transparent, electrically conductive layers or insulating layers having at least two contact electrodes are arranged (Fig. 2).