Profile measurement using contactless sensor - having lower scanning speed for critical profile regions and designed esp. for tight curves

A method of measuring a measurement object profile involves moving the object w.r.t. a contactless sensor. The measurement arrangement produces measurement values from each sensor value within a defined time. The method provides reliable elimination of unacceptably large measurement errors, esp. wit...

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Bibliographic Details
Main Author KLEMENT,EKKEHARD,DR
Format Patent
LanguageEnglish
German
Published 06.05.1982
Subjects
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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Summary:A method of measuring a measurement object profile involves moving the object w.r.t. a contactless sensor. The measurement arrangement produces measurement values from each sensor value within a defined time. The method provides reliable elimination of unacceptably large measurement errors, esp. with profiles contg. tight curves. This is achieved by adjusting the continuous relative speed between the measurement object (1) and the sensor (2) according to the profile so that the incremental distances (AX) covered in the measurement periods are sufficiently under at critical points on the profile. The speed is reduced for critical profile points and raised to a permitted higher value for non-critical regions of the profile. The profile is monitored for critical regions by evaluating curvature from the last three measurement points.
Bibliography:Application Number: DE19803035871