CMOS-Schaltung mit teilweise dielektrisch isolierten Source-Drain-Bereichen und Verfahren zu ihrer Herstellung

A CMOS circuit has all-around dielectrically insulated source-drain regions. Trenches are formed in the source-drain regions. The trenches are etched into the mono-crystalline silicon and filled with undoped or very lightly doped silicon. The completely or nearly completely depleted silicon in the t...

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Bibliographic Details
Main Authors WIDMANN, DIETRICH, KERBER, MARTIN
Format Patent
LanguageGerman
Published 21.10.1999
Edition6
Subjects
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Summary:A CMOS circuit has all-around dielectrically insulated source-drain regions. Trenches are formed in the source-drain regions. The trenches are etched into the mono-crystalline silicon and filled with undoped or very lightly doped silicon. The completely or nearly completely depleted silicon in the trenches represents a dielectrically insulating layer and insulates the source-drain regions towards the adjacent silicon substrate.
Bibliography:Application Number: DE19971006789