METHOD FOR DETECTING AND CORRECTING FAILURE IN MOUNTING OF ELECTRONIC PARTS ON SUBSTRATE AND APPARATUS THEREFOR

A method and apparatus for detecting and enabling correction of a failure in the mounting of electronic parts on substrates, capable of automatically and efficiently accomplishing the detection of a failure in the mounting of electronic parts on substrates, and classification between failed substrat...

Full description

Saved in:
Bibliographic Details
Main Author MASATOSHI OOTA
Format Patent
LanguageEnglish
Published 10.06.1987
Edition4
Subjects
Online AccessGet full text

Cover

Loading…
Abstract A method and apparatus for detecting and enabling correction of a failure in the mounting of electronic parts on substrates, capable of automatically and efficiently accomplishing the detection of a failure in the mounting of electronic parts on substrates, and classification between failed substrates and acceptable substrates to improve the overall operation efficiency of an electronic parts mounting line. The method is adapted to apply a code mark to each substrate on which electronic parts are to be mounted, detect a failure the mounting after, read and store the code marks and failure data of failed substrates, and classify the failed substrates from acceptable substrates and transfer the failed substrates on the basis of the code marks and failure data stored.
AbstractList A method and apparatus for detecting and enabling correction of a failure in the mounting of electronic parts on substrates, capable of automatically and efficiently accomplishing the detection of a failure in the mounting of electronic parts on substrates, and classification between failed substrates and acceptable substrates to improve the overall operation efficiency of an electronic parts mounting line. The method is adapted to apply a code mark to each substrate on which electronic parts are to be mounted, detect a failure the mounting after, read and store the code marks and failure data of failed substrates, and classify the failed substrates from acceptable substrates and transfer the failed substrates on the basis of the code marks and failure data stored.
Author MASATOSHI OOTA
Author_xml – fullname: MASATOSHI OOTA
BookMark eNqNjc0KwjAQhHPQg3_vsC8gqBXxGtONDbSbstmcS5F4krZQ3x9L6QN4Gma-YWarVl3fpY3qK5TC52A9Q46CRhw9QVMOxjMv1mpXRkZwBJWPNGfeApYTZ0_OQK1ZAniCEB9BWAvOG7qegJYYQApknE72av1uP2M6LLpTYFFMcUxD36RxaF-pS9_G0P12Pl2z60Vnf1R-iRw44A
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
Physics
Edition 4
ExternalDocumentID CN86104342A
GroupedDBID EVB
ID FETCH-epo_espacenet_CN86104342A3
IEDL.DBID EVB
IngestDate Fri Jul 19 15:09:58 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_CN86104342A3
Notes Application Number: CN19861004342
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19870610&DB=EPODOC&CC=CN&NR=86104342A
ParticipantIDs epo_espacenet_CN86104342A
PublicationCentury 1900
PublicationDate 19870610
PublicationDateYYYYMMDD 1987-06-10
PublicationDate_xml – month: 06
  year: 1987
  text: 19870610
  day: 10
PublicationDecade 1980
PublicationYear 1987
RelatedCompanies TDK CORP
RelatedCompanies_xml – name: TDK CORP
Score 2.384
Snippet A method and apparatus for detecting and enabling correction of a failure in the mounting of electronic parts on substrates, capable of automatically and...
SourceID epo
SourceType Open Access Repository
SubjectTerms BASIC ELECTRIC ELEMENTS
CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
PRINTED CIRCUITS
SEMICONDUCTOR DEVICES
TESTING
Title METHOD FOR DETECTING AND CORRECTING FAILURE IN MOUNTING OF ELECTRONIC PARTS ON SUBSTRATE AND APPARATUS THEREFOR
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19870610&DB=EPODOC&locale=&CC=CN&NR=86104342A
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfR3LTsMwLBrjeYMBYryUA-qtYqPpHocKdWlKi9ak6lK0G1raIu3STayI38cN2-ACx9iSI1tybMcvhO5mEHDZw8wyh4Vlm0SpzByqN2JmeV6Pu8l6ma6qjHgvSMnz1J420HzTC6PnhH7q4YigURnoe6Xf6-XPJ5anaytX92oOoMWjLx3PyL_bxeqkXbdjeCOHxcIT1KDUodzgiTMAOLHIg7uDdsGL7tfKwF5GdVPK8rdF8Y_RXgzEyuoENYqyhQ7pZvFaCx1E63x3C-3rAs1sBcC1Eq5O0SJiMhAehvgNe0wyKkP-hF3uYSqSZH303XCcJgyHHEci5RomfMzGgE8EDymOwZWdYMHxJB3Vm5Ml0zTcGBCuTCdYBixhcMkZwj6TNDCBh9etvF4p33JrnaNmuSiLC4SJXVhEFbnqzGxiDWaDTPX6fXCHLHADIJZso_afZC7_wV2ho1rwdflUt3ONmtX7R3EDhrpSt1rEX6QMjkk
link.rule.ids 230,309,783,888,25576,76876
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfR3LTsMwzBrjMW4wQIxnDqi3io22exwq1KUpLbTp1KVot2l9IO3STayI38cN2-ACx9iSIztybCd-ANzNMOAyBqmmDnLNUPUkSdVB8qaraZZV7W7SbiqzKgPedWP9eWJMajDf1MLIPqGfsjkialSK-l7K-3r584hly9zK1X0yR9Di0RGmrWTf5WLVp12nrdhDk41CO6QKpSblCo_MPsJ1TX-wdmAXPexepQzsdVgVpSx_WxTnCPZGSKwoj6GWF01o0M3gtSYcBOv_7ibsywTNdIXAtRKuTmARMOGGNsH4jdhMMCo8_kQsbhMaRtF66VieH0eMeJwEYcwlLHQI8xEfhdyjZISu7JiEnIzjYTU5WTBJwxohwhLxmAiXRQw3OQXiMEFdFXmYbuU1pXzLrXYG9WJR5OdAdCPX9CTPkvbM0LX-rJ8m3V4P3SEN3QCMJVvQ-pPMxT-4W2i4IvCnvsdfLuGwOoQqlarTvoJ6-f6RX6PRLpMbKe4vfSqRPA
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=METHOD+FOR+DETECTING+AND+CORRECTING+FAILURE+IN+MOUNTING+OF+ELECTRONIC+PARTS+ON+SUBSTRATE+AND+APPARATUS+THEREFOR&rft.inventor=MASATOSHI+OOTA&rft.date=1987-06-10&rft.externalDBID=A&rft.externalDocID=CN86104342A