Adapter structure for testing integrated circuit

• Main Author: CHAOYI DUAN
• Format: Patent
• Language: English
• Published: 26.01.2005
• Edition: 7
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The utility model relates to an adapter structure for testing a paster integrated circuit, which comprises a lower plate (2), an upper cover assembly (1) which is matched with the lower plate (2) and probes (4), wherein, the middle of the lower plate (2) is provided with an integrated circuit positioning plate (21) and a position limiting plate (22). The position limiting plate (22) and the lower plate (2) are both fixed with a testing circuit board, the positioning plate (21) is fixedly or movably connected with the position limiting plate (22), the position limiting plate (22) and the positioning plate (21) are provided with through holes, and the pin distance from the through holes to every conductive point of a tested integrated circuit is same. The tail end of every probe (4) is electrically connected with the testing circuit board by passing through the through holes arranged on the positioning plate (21) and the position limiting plate (22), so as to arrange the tested integrated circuit in the positioning plate (21). Every conductive point of the tested integrated circuit is electrically connected with the head end of every probe (4), so that the test for every conductive point of the tested integrated circuit is completed by the probes (4). The adapter structure of the utility model has the technical effects of low production cost, long service life and high testing accuracy.