AHT-1 nuclear test system card testing device

• Main Authors: ZHU WEIJIAN, YUAN CHUNHAI, LEE GA-YEON, ZHENG SHUAI, ZHANG JIANPING, ZHU PENGFEI, LI JIE, TIAN YE, LU JIAN, FU KEKE, GAO BINGHAN, WANG GUANGWEI, HUANG JING
• Format: Patent
• Language: Chinese; English
• Published: 26.07.2024
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The utility model discloses an AHT-1 nuclear test system card testing device which comprises an AHT-1 nuclear test system card. Comprising an impedance/power supply voltage inspection module, a test board mode high-voltage output function inspection module, a measurement mode high-voltage output function inspection module, a test mode output detection function inspection module, a measurement mode output monitoring function inspection module and a data processing module. The impedance/power supply voltage inspection module, the test board mode high-voltage output function inspection module, the measurement mode high-voltage output function inspection module, the test mode output detection function inspection module and the measurement mode output monitoring function inspection module are respectively connected with the data processing module. 本实用新型公开了一种AHT-1核测系统卡件测试装置，包括AHT-1核测系统卡件，包括阻抗/电源电压检验模块、测试版模式高压输出功能检验模块、测量模式高压输出功能检验模块、测试模式输出检测功能检验模块、测量模式输出监测功能检验模块和数据处理模块；所述的阻抗/电源电压检验模块、测试版模式高压输出功能检验模块、测量模式高压输出功能检验模块、测