Chip testing and sorting device

• Main Authors: JIA JINKUN, ZHONG CHUNLING, JIA JINLIN
• Format: Patent
• Language: Chinese; English
• Published: 26.07.2024
• Subjects: BASIC ELECTRIC ELEMENTS; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR; ELECTRICITY; PERFORMING OPERATIONS; POSTAL SORTING; SEMICONDUCTOR DEVICES; SEPARATING SOLIDS FROM SOLIDS; SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTEDPIECE-MEAL, e.g. BY PICKING; TRANSPORTING

The utility model discloses a chip testing and sorting device which comprises a conveying belt mechanism and a testing mechanism, one side of the conveying belt mechanism is provided with a sorting frame, the other side of the conveying belt mechanism is provided with a plurality of groups of guide grooves and sorting and collecting hoppers, and the sorting and collecting hoppers are located below the guide grooves; the sorting frame comprises a plurality of groups of sorting positions, when the chips of the specified category are moved to the specified sorting positions, the chips are blown to the material guide groove through the blowing pump and the blowing pipe on the sorting frame and enter the sorting collection hopper through the material guide groove, so that the chips are sorted, the chips are sorted in a blowing mode, the sorting mode is simple, the sorting efficiency is high, and the sorting efficiency is high. The whole device is simple in structure and low in operation cost; the multiple sets of