Adjustable flaw detection frame of X-ray flaw detection machine

• Main Authors: LI BINGFENG, WANG NINGNING, MA BOLUN, XIAO ZHEN, WANG ZHAOLIANG, ZHANG YIN
• Format: Patent
• Language: Chinese; English
• Published: 18.06.2024
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The utility model discloses an adjustable flaw detection frame of an X-ray flaw detection machine. The adjustable flaw detection frame comprises an I-shaped support, a first support frame, a second support frame, a first inner sleeve, a second inner sleeve and a third inner sleeve, one end of the first inner sleeve is vertically fixed on one I-shaped support, and the other end of the first inner sleeve is sleeved in the second support frame; one end of the second inner sleeve is vertically fixed on the other I-shaped support, and the other end of the second inner sleeve is sleeved in the first support frame; nut clamping pieces are arranged on the outer sides of the second supporting frame and the first supporting frame and used for fixing the position of the inner sleeve. The two ends of the third inner sleeve are arranged in the two I-shaped supports in a sleeved mode respectively. The length of the device can be adjusted, so that the device is suitable for X-ray flaw detectors of different models; the heig