Device for inspecting symmetry degree of turnout close-fitting inspector support

• Main Authors: SUN GANGGANG, ZHANG XIQUAN, CHEN DAN, HAN XIAO, PENG ZHENGRONG, LIU XIAO, DUAN GUIMEI, SONG HUI, FU XIAOWEI
• Format: Patent
• Language: Chinese; English
• Published: 11.06.2024
• Subjects: MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING

The utility model relates to a device for inspecting the symmetry degree of a turnout close-fitting inspector support, which is characterized by comprising a support (1), a movable contact shaft (3), an inspection block (9), an inspection base (10), a spline hole (11) and a groove (12), the movable contact shaft (3) is inserted into a shaft hole at the lower end of the inspection base (10) and a shaft hole of the support (1) to be matched with the movable contact shaft (3), so that the movable contact shaft (3), the inspection base (10) and the support (1) form a shaft connector; a groove (12) is formed in the middle end of the upper end of the inspection base (10), a spline hole (11) is formed in one end of the movable contact shaft (3), and the axis of the spline hole (11) and the center of the groove (12) in the upper end of the inspection base (10) are located at the position perpendicular to the horizontal plane, namely, the axis of the spline hole (11) is aligned with the center of the groove (12) in th