Silicon oscillator test auxiliary device based on automatic test system

• Main Authors: SU SHUXIN, ZHAO YONGXING, LI YONGMEI, HE KANG, QUAN HONGQIAO, YANG MIN, LI XIANYA, SONG FANG, YANG YI, LIU KE
• Format: Patent
• Language: Chinese; English
• Published: 19.01.2024
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The utility model relates to a silicon oscillator test auxiliary device based on an automatic test system, comprising a base plate, a pillar, a silicon oscillator clamp, gating resistors and a relay, the base plate is provided with a power interface, an oscilloscope interface, a GND end and a V + end, the silicon oscillator clamp, the gating resistors and the relay are installed on the base plate, the number of the gating resistors is more than two, and the relay is connected with the oscilloscope interface. The relays are in one-to-one correspondence with the gating resistors, the two ends of each gating resistor are connected with the second slot and the third slot through the corresponding relays respectively, the signal output end of the first slot is connected with the V + end, the positive end and the negative end of the digital oscilloscope interface are connected with the third slot and the second slot respectively, and the oscilloscope interface is connected with the oscilloscope. The power interface