Special scanning electron microscope clamp for round titanium sheet section fracture sample

• Main Authors: YOO JAEHO, CAO YUBAO, WANG HONG
• Format: Patent
• Language: Chinese; English
• Published: 12.01.2024
• Subjects: BASIC ELECTRIC ELEMENTS; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS; ELECTRICITY; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The utility model discloses a special fixture for a scanning electron microscope of a round titanium sheet cross section fracture sample, which belongs to the technical field of clamping and fixing of the special round titanium sheet cross section fracture sample for the scanning electron microscope, and comprises a bolt support plate, a profiling base and a baffle plate which are sequentially connected through bolts, and the upper surface of the profiling base is provided with a semi-cylindrical groove along the horizontal direction; a plurality of circular titanium sheet samples can be placed in the semi-cylindrical groove, the bolt supporting plate is in threaded connection with a flat head bolt in the length direction of the semi-cylindrical groove, the plurality of circular titanium sheet samples can be conveniently clamped by screwing the flat head bolt, the structure is simple, the use is convenient, the detection efficiency can be improved, and the image quality of the scanning electron microscope is