Automatic testing device for steady-state performance of LED chip

• Main Authors: HUANG ZHANGTING, HUANG ZIPEI, ZHANG FENG, ZHENG GAOLIN
• Format: Patent
• Language: Chinese; English
• Published: 16.06.2023
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The utility model relates to the technical field of semiconductors, in particular to an LED chip steady-state performance automatic testing device which comprises an optical flat plate, an integrating sphere, a heater, a lamp bead support and an LED chip. The integrating sphere is slidably arranged on the optical flat plate along an axis; the heater is arranged on the optical flat plate, the lamp bead support is arranged on the heater, and the more than two LED chips are arranged on the lamp bead support at intervals in the direction parallel to the axis. The LED chip steady-state performance automatic testing device provided by the utility model has the advantages of simple structure, easy implementation, fast testing efficiency and high precision. 本实用新型涉及半导体技术领域，尤其涉及一种LED芯片稳态性能自动测试装置，包括光学平板、积分球、加热器、灯珠支架和LED芯片；所述积分球沿一轴线滑动设置在光学平板上；所述加热器设置在光学平板上，所述灯珠支架设置在加热器上，两个以上所述LED芯片沿平行于所述轴线的方向间隔设置在灯珠支架上。本实用新型提供的LED芯片稳态性能自动测试装置具有结构简单、易于实施，具有测试效率快、精度高的优点。