Device for measuring electromagnetic backscattering coefficient of material

• Main Authors: TONG CHUANGMING, WANG ZHAOLONG, PENG PENG, WANG TONG, SONG TAO, WANG QINGKUAN, WANG YIJIN, SUN HUALONG
• Format: Patent
• Language: Chinese; English
• Published: 16.06.2023
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The utility model discloses a device for measuring the electromagnetic backscattering coefficient of a material, which comprises a working platform, and a directional antenna, a focusing lens antenna and a vector network analyzer which are arranged on the working platform, and further comprises a to-be-measured material fixing mechanism which is arranged on the working platform through a height adjusting assembly. A clamping and fixing assembly is arranged on the to-be-tested material fixing mechanism and is matched with the to-be-tested material for use; through the arrangement of the height adjusting assembly, the to-be-tested material fixing mechanism and the clamping and fixing assembly, materials to be tested can be fixed according to the thicknesses and volumes of different materials to be tested during use, and meanwhile, the positions of the materials to be tested can be adjusted according to needs, so that the focus of a focusing lens electric wire is hit on the surfaces of the materials; the electro