Testing device for self-heating effect of semiconductor device

• Main Authors: NI TAO, LUO JIAJUN, LIU JIANZHANG, ZHAO FAZHAN, LI YIFAN, GAO LINCHUN, ZENG CHUANBIN, ZHANG XU, WANG JUANJUAN, QIAN PIN, CAI XIAOWU, HAN ZHENGSHENG
• Format: Patent
• Language: Chinese; English
• Published: 17.01.2023
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The utility model provides a device for testing the self-heating effect of a semiconductor device. The device comprises an arbitrary waveform generator; one end of the semiconductor device to be tested is connected with the output end of the arbitrary waveform generator; the input end of the oscilloscope is connected with the other end of the semiconductor device to be tested; as the arbitrary waveform generator can output pulse signals with different pulse widths and different frequencies, the self-heating effect of the semiconductor device can be tested under various working loads; and testing results of the self-heating effect of the semiconductor device on the electrical characteristics of the device under different workloads are obtained, so that data support can be effectively provided for optimization of a device structure and a circuit design, and guidance is provided for actual working conditions of the device. 本实用新型提供了一种半导体器件自加热效应的测试装置，所述装置包：任意波形发生器；待测半导体器件，所述待测半导体器件的一端与所述任意波形发生器的输出端相连接；示波器，所述示波器的输入