Integrated circuit chip aging test device

The utility model discloses an integrated circuit chip aging test device, which comprises test equipment and further comprises a movable base, one end of the movable base is provided with movable wheels, the other end of the movable base is provided with a handle, the top end of the movable base is...

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Bibliographic Details
Main Author KE MEIYAN
Format Patent
LanguageChinese
English
Published 15.11.2022
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:The utility model discloses an integrated circuit chip aging test device, which comprises test equipment and further comprises a movable base, one end of the movable base is provided with movable wheels, the other end of the movable base is provided with a handle, the top end of the movable base is provided with a plurality of lifting mechanisms, and each lifting mechanism comprises a telescopic sleeve arranged on the movable base. The ends, away from the movable base, of the telescopic sleeves are connected with supporting rods in a sleeving mode, the two supporting rods on the same side are connected through limiting and reinforcing assemblies, and each limiting and reinforcing assembly comprises a limiting supporting rod used for opening the two supporting rods on the same side, a through hole formed in the top end of the corresponding telescopic sleeve, and a plurality of limiting grooves formed in the supporting rods. Each limiting supporting rod comprises a limiting inserting rod connected with the two
Bibliography:Application Number: CN202221983103U