Downward pressing type probe test seat for batch test of samples

• Main Author: ZHU YUFAN
• Format: Patent
• Language: Chinese; English
• Published: 09.09.2022
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The utility model relates to a pressing type probe test seat for batch test of samples, which comprises a base, an upper cover is arranged above the base, one end of the upper cover is rotatably connected with the base, the bottom of the upper cover is movably connected with a pressing block, and a probe plug board is arranged at the position, opposite to the pressing block, in the base. The test bench has the following advantages that the test bench can be used for testing a large number of devices at a time, meanwhile, due to the fact that the devices are arranged in the tray, a tester only needs to replace the tray with tweezers or a mechanical arm, and then sample replacement work can be carried out; the testing efficiency is improved, and the labor intensity of workers is reduced. 本实用新型一种批量测试样品的下压式探针测试座，包括底座，底座的上方设有上盖，上盖的一端与底座转动连接，上盖的底部活动连接有压块，底座的内部相对压块的位置设有探针插板，底座的内部且位于探针插板的上方可拆卸连接有器件托盘，本实用新型具有以下优点：而本测试座可以一次进行大量器件的测试，同时因为器件置于托盘中的原因，测试人员只需要用镊子或者机械手臂更换托盘便可进行样品替换的工作，提高了测试的效率，降低工作人员的劳动强度。