Clamp plate and test system

• Main Author: LUO JIANQING
• Format: Patent
• Language: Chinese; English
• Published: 06.09.2022
• Subjects: ELECTRIC COMMUNICATION TECHNIQUE; ELECTRICITY; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING; TRANSMISSION

The utility model discloses a clamp plate and a test system. A hollow hole is formed in the clamp plate, the hollow hole is filled with a high-frequency probe, one end of the high-frequency probe is connected to an instrument through a first radio frequency line, a second radio frequency line connected to the other end of the high-frequency probe is connected to a power meter through an auxiliary line, and the instrument and the power meter are used for testing the loss of the clamp plate. According to the clamp plate and the test system, the high-frequency probe is adopted, the impedance of a radio frequency path formed by the high-frequency probe and the radio frequency line can be directly matched to 50 ohms, impedance matching debugging does not need to be carried out, and the cost is saved. 本申请公开一种夹具板及测试系统。夹具板上设置有镂空孔，所述镂空孔填充有高频探针，所述高频探针的一端通过第一射频线连接至仪表，所述高频探针的另一端连接的第二射频线通过辅助线连接至功率计，所述仪表和所述功率计用于测试所述夹具板的损耗。本申请的夹具板及测试系统，采用了高频探针，可以使高频探针到射频线形成的射频通路的阻抗直接匹配到50欧姆，无需再进行阻抗匹配调试，节省了成本。