Probe card tray device for probe station

The utility model provides a probe card tray device for a probe station, which comprises a probe card tray placing table and a probe card tray, and is characterized in that the probe card tray comprises a positioning support, and a hollow groove is arranged in the positioning support; wherein the po...

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Bibliographic Details
Main Authors QI YINGFEI, YE HONGBO
Format Patent
LanguageChinese
English
Published 29.03.2022
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Abstract The utility model provides a probe card tray device for a probe station, which comprises a probe card tray placing table and a probe card tray, and is characterized in that the probe card tray comprises a positioning support, and a hollow groove is arranged in the positioning support; wherein the positioning support is provided with a plurality of positioning hole pairs, and each positioning hole pair comprises two positioning holes which are symmetrically formed in the positioning support along the circumference of the hollow groove; the probe card tray placing table is provided with a positioning column pair, the positioning column pair comprises two positioning columns, the positioning columns correspond to the positioning holes in shape, and the column center distance between the positioning columns is equal to the hole center distance between the positioning holes. The annular sealing element is arranged at the bottom of the hollow groove, so that the stress of the probe card during working is buffered,
AbstractList The utility model provides a probe card tray device for a probe station, which comprises a probe card tray placing table and a probe card tray, and is characterized in that the probe card tray comprises a positioning support, and a hollow groove is arranged in the positioning support; wherein the positioning support is provided with a plurality of positioning hole pairs, and each positioning hole pair comprises two positioning holes which are symmetrically formed in the positioning support along the circumference of the hollow groove; the probe card tray placing table is provided with a positioning column pair, the positioning column pair comprises two positioning columns, the positioning columns correspond to the positioning holes in shape, and the column center distance between the positioning columns is equal to the hole center distance between the positioning holes. The annular sealing element is arranged at the bottom of the hollow groove, so that the stress of the probe card during working is buffered,
Author QI YINGFEI
YE HONGBO
Author_xml – fullname: QI YINGFEI
– fullname: YE HONGBO
BookMark eNrjYmDJy89L5WTQCCjKT0pVSE4sSlEoKUqsVEhJLctMTlVIyy9SKABLFZcklmTm5_EwsKYl5hSn8kJpbgYlN9cQZw_d1IL8-NTigsTk1LzUknhnPyNDM0MTE0sDk9BQY6IUAQDouSqC
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
Physics
DocumentTitleAlternate 探针台用探针卡托盘装置
ExternalDocumentID CN216144904UU
GroupedDBID EVB
ID FETCH-epo_espacenet_CN216144904UU3
IEDL.DBID EVB
IngestDate Fri Jul 19 15:27:57 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language Chinese
English
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_CN216144904UU3
Notes Application Number: CN202023300421U
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220329&DB=EPODOC&CC=CN&NR=216144904U
ParticipantIDs epo_espacenet_CN216144904UU
PublicationCentury 2000
PublicationDate 20220329
PublicationDateYYYYMMDD 2022-03-29
PublicationDate_xml – month: 03
  year: 2022
  text: 20220329
  day: 29
PublicationDecade 2020
PublicationYear 2022
RelatedCompanies SHANGHAI INTEGRATED CIRCUIT RESEARCH AND DEVELOPMENT CENTER LIMITED COMPANY
RelatedCompanies_xml – name: SHANGHAI INTEGRATED CIRCUIT RESEARCH AND DEVELOPMENT CENTER LIMITED COMPANY
Score 3.5189545
Snippet The utility model provides a probe card tray device for a probe station, which comprises a probe card tray placing table and a probe card tray, and is...
SourceID epo
SourceType Open Access Repository
SubjectTerms MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
Title Probe card tray device for probe station
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220329&DB=EPODOC&locale=&CC=CN&NR=216144904U
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfZ3dS8MwEMCPOT_ftCrTqQSR4ktxy9rNPBRhacsQ7IqssrexpinqQ1fWiuhf7yV2zqe9JpBPfrm73F0CcIMQdZXDzEqcJLNsyToWy2RmoWbK7BRFDsKuoi3C_ii2H6fOtAHvq1wY_U7op34cEYkSyHulz-tifYnl6djK8i55w6LFQzBxPbO2jqn6D5yZ3tD1o7E35ibnLg_N8BnBVJYP69jxFmyjGj1QNPgvQ5WVUvwXKcEh7ETYWl4dQeP71YB9vvp5zYC9p9rhbcCujtAUJRbWFJbHcBupHB4icHNJtZx_kVQq3gnqn6TQVeWvg_0ErgN_wkcWdj77m-mMh-txxr1TaOaLXLaADETal12JtoCDxGX3c0lplko0dgSq_JSeQXtDQ-cba9twoBZOxVVRdgHNavkhL1HQVsmVXqEfJ7mAug
link.rule.ids 230,309,783,888,25576,76876
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfZ1LT4NAEIAntT7qTdFGrQ9iDPFCbBFa90BMukBQW0oMmN5IgSXqgZKCMfrrnV2p9dTrbrLPfDszOzO7AFcIUY87zNTYiDNVZ6SrkoxlKmqmRE9R5CDsPNrC67uh_jg1pg14X-bCiHdCP8XjiEhUgrxX4rwuVpdYloitLG_iNyya3zuBaSm1dazx_8CJYg1N259YE6pQalJP8Z4RTG75kK4ebsAmqtgDToP9MuRZKcV_keLswZaPreXVPjS-XyVo0eXPaxLsjGuHtwTbIkIzKbGwprA8gGuf5_DICW6uXC1mX3LKOO8y6p9yIarKXwf7IVw6dkBdFTuP_mYaUW81zvC2Dc18nrMjkAdJ2mc9hraAgcRldzOmaVnK0NhJUOXXtGPorGnoZG3tBbTcYDyKRg_eUwd2-SLyGCuNnEKzWnywMxS6VXwuVusHXFuDrQ
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Probe+card+tray+device+for+probe+station&rft.inventor=QI+YINGFEI&rft.inventor=YE+HONGBO&rft.date=2022-03-29&rft.externalDBID=U&rft.externalDocID=CN216144904UU