Switching device for connecting different types of chip test platforms

• Main Authors: LIU CHENGQUN, HUANG HUTIAN, WANG RUI
• Format: Patent
• Language: Chinese; English
• Published: 08.02.2022
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The utility model discloses a switching device for connecting chip test platforms of different models, which belongs to the technical field of semiconductor test, and comprises a circuit board, a first wiring terminal via hole and a second wiring terminal via hole are arranged on the circuit board, and the first wiring terminal via hole is correspondingly connected with the second wiring terminal via hole; a first connector is welded on the first wiring terminal via hole, and a second connector is welded on the second wiring terminal via hole. The first connector is connected with a first testing machine, and the second connector is connected with a second testing machine. According to the utility model, MXUVI board card resources of the 3380P test machine can be fully utilized, products can be tested across test machine platforms, a test machine or a test machine board card matched with the products does not need to be purchased again, the factory expenditure is saved, the test cost is reduced, and the equip