WLCSP packaging test probe card

• Main Author: GUO ZHONGSHAN
• Format: Patent
• Language: Chinese; English
• Published: 05.11.2021
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The utility model relates to the technical field of semiconductor detection, in particular to a WLCSP (Wafer Level Chip Scale Package) test probe card, which comprises a PCB (Printed Circuit Board) adapter plate and a body contactor, the upper end of the PCB adapter plate is fixedly connected with the body contactor, the outer side of the body contactor is fixedly connected with a base, the lower end of the base is fixedly connected with an adapter plate, the outer side of the base is fixedly connected with a PCB substrate, and the PCB substrate is fixedly connected with the PCB adapter plate. The interior of the body contactor is fixedly connected with a probe assembly, and the middle part of the upper end of the PCB substrate is fixedly connected with a protection cover. According to the utility model, through the arrangement of the PCB adapter plate, the protective cover, the base and the adapter plate, the structure is simple, the assembly, disassembly and maintenance of the device are facilitated, the pr