Low-temperature device for testing deep-energy-level transient spectrum

• Main Authors: WANG FAN, HUANG SHESONG, YANG WEI, FENG CHANGSHA
• Format: Patent
• Language: Chinese; English
• Published: 23.06.2020
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The utility model discloses a cryogenic device for deep energy level transient spectrum testing, which comprises a vacuum shell, an instrument skirt for providing an instrument interface and a valve,and a refrigerator, and the vacuum shell, the instrument skirt for providing the instrument interface and the valve, and the refrigerator are sequentially connected from top to bottom. Wherein a coldshield is arranged in the vacuum shell and is fixed on a first-stage cold head of the refrigerating machine, a high-temperature table is arranged on a second-stage cold head, and the probe sample support is arranged on the high-temperature table. A two-stage 10K or 4K refrigerating machine is adopted as a cold source, a low-temperature environment with the temperature range of 4K-500K or 10K-500Kand the temperature fluctuation smaller than +/-50mk and a probe sample convenient for needle insertion are provided, deep-energy-level transient spectrum testing is facilitated, and the efficiency ofdeep-energy-level transient