Wave plate phase retardation measuring instrument

• Main Authors: WU TONGLI, SUN BAOPING, CHEN XIANQUAN, WU BIN, ZHONG JINGLIANG, GUI SICHENG, CHEN GENG, WANG CHUNYU
• Format: Patent
• Language: Chinese; English
• Published: 26.11.2019
• Subjects: CONTROLLING; MEASURING; PHYSICS; REGULATING; SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES; TESTING; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR

The utility model relates to a wave plate phase retardation measuring instrument. The first objective table bears a wave plate to be measured. The first thermistor is connected with the first objective table; the temperature of the first objective table can be detected; the first semiconductor chilling plate and the first objective table are sequentially arranged at the top of the first rotating table from bottom to top; the first semiconductor chilling plate can adjust the temperature of the first objective table, thereby providing a stable environment temperature for the wave plate to be measured, reducing the impact on the temperature-sensitive part, i.e., the wave plate to be measured from the external environment, and improving the measurement precision of the phase delay degree of the wave plate. 本实用新型涉及一种波片相位延迟度测量仪，第一载物台承载待测波片，第一热敏电阻与第一载物台连接，能够对第一载物台的温度进行检测，第一半导体制冷片和第一载物台自下而上依次设于第一旋转台的顶部，第一半导体制冷片能够调节第一载物台的温度，进而给待测波片提供稳定的环境温度，降低外界环境对待测波片这一温度敏感件的影响，提高波片相位延迟度的测量精度。