Quartz crucible bubble depletion layer thickness gauge

• Main Authors: DU XINGLIN, ZHU LIJUN, ZHANG BEIMING, MA JUNFEI
• Format: Patent
• Language: Chinese; English
• Published: 18.10.2019
• Subjects: MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING

The utility model discloses a thickness gauge for a bubble depletion layer of a quartz crucible. The thickness gauge comprises a detection base and a television microscope, wherein the detection basecomprises two vertically arranged brackets, a microscope fixing plate is fixedly arranged between the tops of the two brackets, a television microscope is arranged on the microscope fixing plate, andan objective lens of the television microscope is arranged between the two brackets below the microscope fixing plate; a lens synchronizing bar parallel to the optical axis of the television microscope is arranged on the side wall of the lens of the objective lens, and a reference bar perpendicular to the optical axis of the television microscope is arranged at the end of the lens synchronizing bar below the lens of the objective lens; the top end of the reference rod is arranged in the visual field of the television microscope; and a microswitch is arranged on the bottom surface of the reference rod. The method has th