Device for measuring critical current density and critical temperature during compression of superconducting film
The utility model discloses a device for measuring critical current density and critical temperature during compression of a superconducting film. The device comprises a vacuum box, a testing machinepressure head, a glass fiber plate arranged in the vacuum box and a superconducting thin film sample...
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Main Authors | , , , , , |
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Format | Patent |
Language | Chinese English |
Published |
23.08.2019
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Subjects | |
Online Access | Get full text |
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Summary: | The utility model discloses a device for measuring critical current density and critical temperature during compression of a superconducting film. The device comprises a vacuum box, a testing machinepressure head, a glass fiber plate arranged in the vacuum box and a superconducting thin film sample pressing clamp, a tester pressure head is inserted into the top of the vacuum box; upper and lowerglass fiber plates are arranged below the testing machine pressure head; wherein a superconducting film sample pressing clamp is clamped between the two glass fiber plates, the superconducting film sample pressing clamp comprises an upper clamp, a beryllium copper beam and a lower clamp, the beryllium copper beam is placed between the upper clamp and the lower clamp, a groove for placing a superconducting film sample is formed in the middle of the top surface of the beryllium copper beam, and a thermometer and a strain gauge are fixed on the sample; a heating resistor is arranged on the beryllium copper beam, and a ref |
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Bibliography: | Application Number: CN201822075009U |