Device for measuring critical current density and critical temperature during compression of superconducting film

• Main Authors: ZHANG XINGYI, WANG JUN, SU XIYANG, ZHOU JUN, ZHOU YOUHE, LIU CONG
• Format: Patent
• Language: Chinese; English
• Published: 23.08.2019
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; MEASURING QUANTITY OF HEAT; MEASURING TEMPERATURE; PHYSICS; TESTING; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR

The utility model discloses a device for measuring critical current density and critical temperature during compression of a superconducting film. The device comprises a vacuum box, a testing machinepressure head, a glass fiber plate arranged in the vacuum box and a superconducting thin film sample pressing clamp, a tester pressure head is inserted into the top of the vacuum box; upper and lowerglass fiber plates are arranged below the testing machine pressure head; wherein a superconducting film sample pressing clamp is clamped between the two glass fiber plates, the superconducting film sample pressing clamp comprises an upper clamp, a beryllium copper beam and a lower clamp, the beryllium copper beam is placed between the upper clamp and the lower clamp, a groove for placing a superconducting film sample is formed in the middle of the top surface of the beryllium copper beam, and a thermometer and a strain gauge are fixed on the sample; a heating resistor is arranged on the beryllium copper beam, and a ref