Semiconductor chip tests manual probe station

The utility model discloses a semiconductor chip tests manual probe station, including observation platform, mesh hole, syringe needle fixed plate and diaphragm, the below of observation platform is provided with the operation panel, the below intermediate position department of operation panel is p...

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Bibliographic Details
Main Author YANG GENGHUA
Format Patent
LanguageChinese
English
Published 13.03.2018
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:The utility model discloses a semiconductor chip tests manual probe station, including observation platform, mesh hole, syringe needle fixed plate and diaphragm, the below of observation platform is provided with the operation panel, the below intermediate position department of operation panel is provided with puts the thing platform, the below of putting the thing platform is provided with the base, the top at the observation platform is installed in the mesh hole, the below in mesh hole is provided with an eyepiece supporting bench, an eyepiece supporting bench's below intermediate positiondepartment is provided with real empty room, through adjusting the sliding tray, the sliding tray promotes the buckle, and is firmly fixed the probe, is provided with two needle retaining framves inthe both sides of probe, detects and accomplishes the back, and the probe leans on on the needle retaining frame, and is unstable because of probe fixing when avoiding testing, the problem of test error appears, puts the thing
Bibliography:Application Number: CN201721026941U