Signal conversion device used for luminescence microscope to find chip defect

• Main Authors: CHEN YANNING, NIE QIHE, ZHANG HAIFENG, SHAN LANTING, LI BOHAI
• Format: Patent
• Language: Chinese; English
• Published: 16.04.2014
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The utility model discloses a signal conversion device used for a luminescence microscope to find a chip defect. The signal conversion device comprises a PCB. The middle of the PCB is provided with a window portion; the window portion is made of a transparent material for pasting a chip; the transparent material is a piece of thin glass or a hard plastic plate. According to the utility model, through the conversion of the PCB, the conversion of chip pins is realized, abutting joining with an original test plate is finished, and the chip is loaded with dynamic signals; the signal conversion device, while providing dynamic testing, can take static state testing into consideration, and performs IV curve measuring before and after the dynamic testing; and the signal conversion device provided by the utility model can also take various chip dimensions and the number of PCBs into consideration, and can perform testing on chips with different dimensions and PCB numbers.