Semiconductor resistivity test instrument with functions of automatic measurement range switch and automatic correction

• Main Authors: WANG ZHIQIANG, JI TAO, CAO YIJIANG, WANG ZIMING, FENG JUMENG, ZENG LEI
• Format: Patent
• Language: Chinese; English
• Published: 28.11.2012
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The utility model relates to a semiconductor resistivity test instrument with functions of automatic measurement range switch and automatic correction. The semiconductor resistivity test instrument comprises a test probe station, a self-correction circuit, a constant current source circuit, a voltage amplification circuit, an A/D conversion circuit, a single chip microcomputer processing system and a liquid crystal display system, wherein the single chip microcomputer processing system is in electrical signal connection with the self-correction circuit, the voltage amplification circuit, the constant current source circuit, the A/D conversion circuit and the liquid crystal display system respectively; the test probe station is in electrical signal connection with the constant current source circuit and the voltage amplification circuit respectively; the voltage amplification circuit is in electrical signal connection with the A/D conversion circuit; and the A/D conversion circuit is in electrical signal conne