Double-piece testing mechanism

• Main Author: LIANG DAMING
• Format: Patent
• Language: Chinese; English
• Published: 30.11.2011
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The utility model discloses a double-piece testing mechanism which comprises a separator, a testing area guide rail, a golden finger, a clamping mechanism, a separator cylinder and IC (integrated circuit) devices, wherein the separator is connected with and is pushed by the separator cylinder, the golden finger is fixed at the bottom of the testing area guide rail, and clamping arms are driven by a clamping cylinder in the clamping mechanism to clamp the golden finger. Two IC devices simultaneously enter a testing area through a track, the first IC device is positioned by a baffle plate of the testing area, and the two IC devices are closely contacted by gravity. When a testing position sensor senses the two IC devices, the separator cylinder pushes the separator to separate the two IC devices in a certain distance, and the clamping mechanism clamps the golden finger, therefore, the pins of the first IC device and the second IC device are simultaneously in contact with the golden finger, so that the effect of