Device for integrated circuit test

• Main Authors: DUAN CHAOYI, TAO SHAN, WANG GUOHUA
• Format: Patent
• Language: Chinese; English
• Published: 13.02.2008
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The utility model relates to a test device for integrated circuits, which comprises a pressing component (1), a probe positioning plate (2) and probes, wherein the probe positioning plate (2) is provided with through-holes, the distance between two adjacent through-holes is equal to the distance bet...