Device for integrated circuit test

• Main Authors: DUAN CHAOYI, TAO SHAN, WANG GUOHUA
• Format: Patent
• Language: Chinese; English
• Published: 13.02.2008
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The utility model relates to a test device for integrated circuits, which comprises a pressing component (1), a probe positioning plate (2) and probes, wherein the probe positioning plate (2) is provided with through-holes, the distance between two adjacent through-holes is equal to the distance between two adjacent conductive points of an integrated circuit (4) to be tested, the probes which are spiral springs (3) get through the through-holes on the probe positioning plate (2), the upper end of each spiral spring (3) is electrically connected with the integrated circuit (4) to be tested and the lower end is electrically connected with a test printed circuit board (5). Or, each probe comprises a contact pin (6) and a spiral spring (3), one end of the contact pin (6) is provided with a head shape which is electrically connected with the integrated circuit (4) to be tested or the test printed circuit board (5), the other end of the contact pin (6) contacts one end of the spiral spring (3), and accordingly, the