Silicon electrode plate having excellent durability for plasma etching
The invention provides a silicon electrode plate having excellent durability for plasma etching is provided. The electrode plate is made of a silicon single crystal containing boron by an atomic ratio of 3-11ppba and phosphorus or arsenic or both by an atomic ratio of 0.5-6ppba in total.
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Main Author | |
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Format | Patent |
Language | English |
Published |
16.05.2007
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Subjects | |
Online Access | Get full text |
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Summary: | The invention provides a silicon electrode plate having excellent durability for plasma etching is provided. The electrode plate is made of a silicon single crystal containing boron by an atomic ratio of 3-11ppba and phosphorus or arsenic or both by an atomic ratio of 0.5-6ppba in total. |
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Bibliography: | Application Number: CN2005810006 |