Separately strained N-channel and P-channel transistors
An integrated circuit with a first plurality of transistors formed on a first wafer and second plurality of transistors formed on a second wafer. At least a substantial majority of the transistor of the first transistor are of a first conductivity type and at least a substantial majority of the tran...
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Main Author | |
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Format | Patent |
Language | English |
Published |
25.04.2007
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Subjects | |
Online Access | Get full text |
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Summary: | An integrated circuit with a first plurality of transistors formed on a first wafer and second plurality of transistors formed on a second wafer. At least a substantial majority of the transistor of the first transistor are of a first conductivity type and at least a substantial majority of the transistors of the second plurality are of a second conductivity type. After wafers are bonded together, a portion of the second wafer is removed wherein the strain of the channels of the second plurality of transistors is more compressive than the strain of the channels of the first plurality of transistors. |
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Bibliography: | Application Number: CN200580015236 |