Static method and system for basic knowledge for determining semiconductor IC credibility and comparison

• Main Author: WEITING,YANG JIAN
• Format: Patent
• Language: English
• Published: 07.02.2007
• Subjects: CALCULATING; CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION ORPROCESSING OF GOODS; COMPUTING; CONTROL OR REGULATING SYSTEMS IN GENERAL; CONTROLLING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS; PHYSICS; REGULATING; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS; TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINSTCLIMATE CHANGE

The decision method for reliability testing comprises: after pre-check by other methods, applying non-parameter method with well numerical precision and no distribution form to decide the product lifetime. This invention can be used to different data testing data, fit to determine all reliability testing based on comparability index, and has more flexibility, wherein the comparability index is induced by integrate the weighted difference between two reliable functions.